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Geometry-based signature for layout database comparison

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Grenoble 31st may 2018, XYALIS unveils a new method to compare layouts databases using a geometry-based signature enabling a safe and fast traceability process. Read the article on TechDesignForum. As exchanges of layout descriptions between teams involved in modern integrated circuit …

XYALIS at DAC conference 2018 : booth #1610

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Leveraging years of leadership in layout finishing, XYALIS introduces a unique geometry-based signature enabling a safe and fast traceability process. It is tailored to handle the multiplicity of design styles and representation standards specific to electronic design while protecting intellectual property …

XYALIS at SPIE Photomask conference 2017

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XYALIS will demonstrate his new Mask Data Preparation flow, including the automatic generation of SEMI P10 Order Forms. Visit us on booth #107 to know more about what we have achieved at the next SPIE Photomoask Technology Conference, September 12-14, 2017, in Monterey, California, USA. …

XYALIS at DAC conference 2017 : booth #2129

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After 2 years, the long migration started in 2015 has just ended and we are proud to announce that the results are beyond our best expectations. Shrinking geometries, new manufacturing paradigms, exploding file sizes… It’s time to rethink everything! XYALIS …

XYALIS at SPIE Photomask conference 2016

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XYALIS will demonstrate his integrated Mask Data Preparation flow, including the automatic generation of SEMI P10 Order Forms. Visit us on booth #114 to know more about what we have achieved at the next SPIE Photomoask Technology Conference, September 12-14, 2016, in Monterey, California, …